Patent Assignment
Reel/Frame 011969/0447
Invalid Recording. See Reel 012547 Frame 0530. (Re-Recorded to Add an Omitted Page of the Assignment.)
Recorded: 2001-07-11
Pages: 2
Assignors
HAMAMATSU, AKIRA
Executed: 2001-05-28
NOGUCHI, MINORI
Executed: 2001-05-28
OHSHIMA, YOSHIMASA
Executed: 2001-05-29
NISHIYAMA, HIDETOSHI
Executed: 2001-05-28
OKA, KENJI
Executed: 2001-06-27
NINOMIYA, TAKANORI
Executed: 2001-05-28
TANAKA, MAKI
Executed: 2001-06-13
WATANABE, KENJI
Executed: 2001-06-23
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ELECTRONICS ENGINEERING CO. LTD.
F.NISSEL EBISU BLDG., 16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
Method of Inspecting a Semiconductor Device and an Apparatus Thereof
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →