IP Library Assignment 012339/0538
Patent Assignment
Reel/Frame 012339/0538

Assignment of Assignor's Interest

Recorded: 2001-11-30 Pages: 3
Assignors
HAYASHI, HIDEKI
Executed: 2001-11-14
HIGETA, KEIICHI
Executed: 2001-11-14
NAKAHARA, SHIGERU
Executed: 2001-11-14
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ULSI SYSTEMS CO., LTD.
22-1, JOSUIHONCHO 5-CHOME, KODAIRA-SHI, TOKYO, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit Device and Method of Testing It
Patent: 6,779,144 →
Application: 09/996,722 →
Publication: US 2002/0069382
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 11, 2003
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 014190/0088 →
Merger Jun 10, 2011
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 026467/0252 →
Change of Name Jun 10, 2011
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 026467/0279 →
Assignment of Assignor's Interest May 9, 2014
From: HITACHI ULSI SYSTEMS CO., LTD.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 032859/0252 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →