IP Library Assignment 026467/0279
Patent Assignment
Reel/Frame 026467/0279

Change of Name

Recorded: 2011-06-10 Received: 2011-06-14 Pages: 24
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, JPX, JAPAN
Covered Properties (25)
Memory Card and Memory Controller
Application: 12/125,042 →
Insulated Gate Type Semiconductor Device and Method for Fabricating the Same
Application: 12/037,139 →
Semiconductor Integrated Circuit and a Method of Testing the Same
Application: 11/785,537 →
Insulated Gate Type Semiconductor Device and Method for Fabricating the Same
Application: 11/653,404 →
Non-Volatile Semiconductor Memory Device
Application: 11/453,926 →
Clock Generating Method and Clock Generating Circuit
Application: 11/331,154 →
Semiconductor Integrated Circuit and a Method of Testing the Same
Application: 11/329,229 →
Memory Storage Device Having a Nonvolatile Memory and Memory Controller with Error Check Operation Mode
Application: 11/180,538 →
Non-Volatile Semiconductor Memory Device
Application: 11/152,101 →
Nonvolatile Semiconductor Storage and Its Manufacturing Method
Application: 10/496,000 →
Insulated Gate Type Semiconductor Device and Method for Fabricating the Same
Application: 10/984,788 →
Semiconductor Integrated Circuit Device and Process for Producing the Same
Application: 10/899,119 →
Non-Volatile Memory Device and Data Storing Method
Application: 10/796,995 →
Nonvolatile Semiconductor Memory Device and Manufacturing Method Thereof
Application: 10/701,497 →
Non-Volatile Semiconductor Memory Device
Application: 10/616,955 →
Nonvolatile Semiconductor Memory Device and Manufacturing Method Thereof
Application: 10/166,145 →
Method of Manufacturing a Semiconductor Integrated Circuit Device
Application: 10/162,573 →
Semiconductor Integrated Circuit and a Method of Testing the Same
Application: 10/083,399 →
Memory Card and Memory Controller
Application: 10/082,291 →
Non-Volatile Memory Device and Data Storing Method
Application: 10/082,310 →
Non-Volatile Semiconductor Memory Device
Application: 10/078,471 →
Semiconductor Integrated Circuit Device and Process for Producing the Same
Application: 10/031,117 →
Insulated Gate Type Semiconductor Device and Method for Fabricating the Same
Application: 10/046,077 →
Electronic Circuit Equipment Using Multilayer Circuit Board
Application: 10/044,910 →
Semiconductor Integrated Circuit Device and Method of Testing It
Application: 09/996,722 →