Patent Assignment
Reel/Frame 012347/0949
Assignment of Assignor's Interest
Recorded: 2001-12-04
Pages: 3
Assignors
HIRAIDE, TAKAHISA
Executed: 2001-12-03
YAMANAKA, HITOSHI
Executed: 2001-12-03
KUMAGAI, JUNKO
Executed: 2001-12-03
KONISHI, HIDEAKI
Executed: 2001-12-03
MARUYAMA, DAISUKE
Executed: 2001-12-03
Assignee
FUJITSU LIMITED
NAKAHARA-KU, KAWASAKI-SHI, 1-1, KAMIKODANAKA, 4-CHOME, KANAGAWA 211-8588, JAPAN
Covered Property
(1)
Testing Apparatus and Testing Method for an Integrated Circuit, and Integrated Circuit
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 10, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021985/0715 →
Change of Name
Jul 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024794/0500 →
Assignment of Assignor's Interest
Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0851 →