IP Library › Assignment 012821/0700
Patent Assignment
Reel/Frame 012821/0700

Assignment of Assignor's Interest

Recorded: 2002-04-18 Pages: 2
Assignor
NISHIMURA, YASUMASA
Executed: 2002-04-02
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JAPAN
Covered Property (1)
Semiconductor Device, Test Method for Semiconductor Device, and Tester for Semiconductor Device
Patent: 6,768,133 →
Application: 10/124,453 →
Publication: US 2003/0059967
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 13, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0598 →