IP Library Assignment 013273/0088
Patent Assignment
Reel/Frame 013273/0088

Assignment of Assignor's Interest

Recorded: 2002-09-09 Pages: 2
Assignors
MAZUR, ROBERT G.
Executed: 2002-08-23
HILLARD, ROBERT J.
Executed: 2002-08-26
Assignee
SOLID STATE MEASUREMENTS, INC.
110 TECHNOLOGY DRIVE, PITTSBURGH, PENNSYLVANIA, 15275
Covered Properties (2)
Non-Invasive Electrical Measurement of Semiconductor Wafers
Patent: 6,492,827 →
Application: 09/692,659 →
" Non-Invasive Measurement of Electrical Properties of a Dielectric Layer in a Semiconductor Wafer
Application: 60/158,222 →
Related Assignments (1)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 8, 2013
From: SOLID STATE MEASUREMENTS, INC.
To: SEMICONDUCTOR PHYSICS LABORATORY, INC.
Reel/Frame 030172/0092 →