IP Library Assignment 013275/0479
Patent Assignment
Reel/Frame 013275/0479

Assignment of Assignor's Interest

Recorded: 2002-09-09 Pages: 3
Assignors
ABRAHAM, MICHAEL
Executed: 2002-08-29
LANG, ANDREAS
Executed: 2002-08-29
SCHWEIGER, MICHAEL
Executed: 2002-08-29
Assignee
NANOPHOTONICS AG
GALILEO-GALILEI-STR. 28, MAINZ, 55129, GERMANY
Covered Property (1)
Device for Measuring Surface Defects
Patent: 6,954,267 →
Application: 10/237,909 →
Publication: US 2003/0193666
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Feb 13, 2013
From: NANOPHOTONICS AG
To: NANOPHOTONICS GMBH
Reel/Frame 029826/0225 →
Assignment of Assignor's Interest Mar 11, 2013
From: NANOPHOTONICS GMBH
To: RUDOLPH TECHNOLOGIES GERMANY GMBH
Reel/Frame 029980/0606 →
Assignment of Assignor's Interest Jun 30, 2020
From: RUDOLPH TECHNOLOGIES GERMANY GMBH
To: ONTO INNOVATION INC.
Reel/Frame 053084/0849 →