IP Library › Assignment 013595/0752
Patent Assignment
Reel/Frame 013595/0752

Assignment of Assignor's Interest

Recorded: 2002-12-19 Pages: 3
Assignors
KIKUCHI, HIDEO
Executed: 2002-12-12
ODA, MIKIO
Executed: 2002-12-12
KOUTA, HIKARU
Executed: 2002-12-12
KITAJO, SAKAE
Executed: 2002-12-12
SHIMADA, YUZO
Executed: 2002-12-12
MATSUMOTO, YOSHIO
Executed: 2002-12-12
TAMABAYASHI, SHINICHI
Executed: 2002-12-12
Assignee
NEC TOPPAN CIRCUIT SOLUTIONS, INC.
2-2-7, YAESU, CHUO-KU, TOKYO, JAPAN
Covered Property (1)
Method of Inspecting Optical Waveguide Substrate for Optical Conduction at Increased Speed and Also Inspecting Optical Waveguide Substrate for Crosstalk
Patent: 7,106,426 →
Application: 10/322,484 →
Publication: US 2003/0117614
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Apr 21, 2017
From: KYOCERA CIRCUIT SOLUTIONS, INC
To: KYOCERA CIRCUIT SOLUTIONS, INC
Reel/Frame 042303/0889 →
Merger Apr 21, 2017
From: KYOCERA CIRCUIT SOLUTIONS, INC.
To: KYOCERA CORPORATION
Reel/Frame 042522/0699 →