Method of inspecting optical waveguide substrate for optical conduction at increased speed and also inspecting optical waveguide substrate for crosstalk
View Patent ↗There is disclosed a method of inspecting an optical waveguide substrate for optical conduction at an increased inspecting rate and also inspecting an optical waveguide substrate for cross-talk. According to the disclosed method, a laser beam is applied from a laser beam scanning optical system to one end face of an optical waveguide of an optical waveguide substrate which is an object to be inspected, and the laser beam emitted from the other end of the optical waveguide is detected by a CCD camera, which output detected result data. A light spot position confirming device compares the detected result data with stored data.
1. A method of inspecting an optical waveguide substrate having a substrate and an optical waveguide mounted on the substrate and having a first mirror surface on one end face thereof and a second mirror surface on another end thereof, said method comprising the steps of:
applying a laser beam to said one end face in a direction perpendicular to a surface of said optical waveguide, and directing, with said first mirror surface, said laser beam to travel in a direction parallel to the surface of said optical waveguide through said optical waveguide;
directing, with said second mirror surface, the laser beam emitted from said other end face of said optical waveguide to travel in a direction perpendicular to the surface of said optical waveguide;
detecting, with an imaging device, the laser beam directed and emitted from said other end of said optical waveguide, and outputting, from said imaging device, detected image information representative of light spot positions to a light spot position confirming device; and
comparing said detected image information with reference image information stored in said light spot position confirming device, with said light spot position confirming device, to determine whether an amount of light conducted through said optical waveguide is acceptable or not.
2. A method of inspecting an optical waveguide substrate having a substrate, an optical waveguide mounted on the substrate, a first pyramid mirror mounted on the substrate at one end face of said optical waveguide, and a second pyramid mirror mounted on the substrate at another end face of said optical waveguide, said method comprising the steps of:
applying a laser beam to said first pyramid mirror in a direction perpendicular to a surface of said optical waveguide, and directing, with said first pyramid mirror, said laser beam to travel in a direction parallel to the surface of said optical waveguide, from said one end face into and through said optical waveguide;
directing, with said second pyramid mirror, the laser beam emitted from said other end face of said optical waveguide to travel in a direction perpendicular to the surface of said optical waveguide;
detecting, with an imaging device, the laser 10 beam directed and emitted from said other end of said optical waveguide, and outputting, from said imaging device, detected image information representative of light spot positions to a light spot position confirming device; and
comparing said detected image information with reference image information stored in said light spot position confirming device, with said light spot position confirming device, to determine whether an amount of light conducted through said optical waveguide is acceptable or not.
3. A method of inspecting an optical waveguide substrate having a substrate and an optical waveguide mounted on the substrate and having a first mirror surface on one end face thereof and a second mirror surface on another end thereof, said method comprising the steps of:
moving a lens positioned in a terminal portion of the path of a laser beam in a laser beam scanning optical system to deflect the direction in which the laser beam travels;
applying said laser beam to said one end face in a direction perpendicular to a surface of said optical waveguide, and directing, with said first mirror surface, said laser beam to travel in a direction inclined to the surface of said optical waveguide through said optical waveguide;
directing, with said second mirror surface, the laser beam emitted from said other end face of said optical waveguide to travel in a direction perpendicular to the surface of said optical waveguide;
detecting, with an imaging device, the laser beam directed and emitted from said other end of said optical waveguide, and outputting, from said imaging device, detected image information representative of light spot positions to a light spot position confirming device; and
comparing said detected image information with reference image information stored in said light spot position confirming device, with said light spot position confirming device, to determine whether an amount of light conducted through said optical waveguide is acceptable or not.
4. A method of inspecting an optical waveguide substrate having a substrate, an optical waveguide mounted on the substrate, a first pyramid mirror mounted on the substrate at one end face of said optical waveguide, and a second pyramid mirror mounted on the substrate at another end face of said optical waveguide, said method comprising the steps of:
moving a lens positioned in a terminal portion of the path of a laser beam in a laser beam scanning optical system to deflect the direction in which the laser beam travels;
applying said laser beam to said first pyramid mirror in a direction perpendicular to a surface of said optical waveguide, and directing, with said first pyramid mirror, said laser beam to travel in a direction inclined to the surface of said optical waveguide through said optical waveguide;
directing, with said second pyramid mirror, the laser beam emitted from said other end face of said optical waveguide to travel in a direction perpendicular to the surface of said optical waveguide;
detecting, with an imaging device, the laser beam directed and emitted from said other end of said optical waveguide, and outputting, from said imaging device, detected image information representative of light spot positions to a light spot position confirming device; and
comparing said detected image information with reference image information stored in said light spot position confirming device, with said light spot position confirming device, to determine whether an amount of light conducted through said optical waveguide is acceptable or not.