IP Library Assignment 013995/0134
Patent Assignment
Reel/Frame 013995/0134

Assignment of Assignor's Interest

Recorded: 2003-09-25 Pages: 3
Assignors
CHANG, HOUNG-JIE
Executed: 2003-08-27
CHANG, SHENG-JU
Executed: 2003-08-28
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. 1, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Property (1)
[Method for Detecting Defect of Semiconductor Device]
Patent: 6,806,104 →
Application: 10/605,357 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 24, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049562/0151 →
Assignment of Assignor's Interest Jul 12, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049732/0132 →