IP Library Assignment 049732/0132
Patent Assignment
Reel/Frame 049732/0132

Assignment of Assignor's Interest

Recorded: 2019-07-12 Pages: 11
Assignor
POWERCHIP TECHNOLOGY CORPORATION
Executed: 2019-06-28
Assignee
POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
NO. 18, LI-HSIN RD. 1, HSINCHU SCIENCE PARK,, HSINCHU, TAIWAN
Covered Properties (20)
Reticle Transferring Support and Transferring Method Thereof
Patent: 6,882,408 →
Application: 10/604,092 →
Publication: US 2004/0263822
[Memory Device Structure and Method of Fabricating the Same]
Patent: 6,791,136 →
Application: 10/604,366 →
[Split Gate Flash Memory Cell and Manufacutirng Method Thereof]
Patent: 6,768,162 →
Application: 10/604,612 →
Sonos Multi-Level Memory Cell
Patent: 6,943,404 →
Application: 10/604,613 →
Publication: US 2004/0227180
Ion Sampling System for Wafer
Patent: 7,255,114 →
Application: 10/604,793 →
Publication: US 2004/0191140
[Flash Memory Cell, Flash Memory Cell Array and Manufacturing Method Thereof]
Patent: 6,911,690 →
Application: 10/604,819 →
Publication: US 2004/0232473
[Sputtering Apparatus and Manufacturing Method of Metal Layer/Metal Compound Layer by Using Thereof]
Patent: 6,811,662 →
Application: 10/604,857 →
[Flash Memory Cell and Fabricating Method Thereof]
Patent: 6,815,758 →
Application: 10/604,861 →
Re-Performable Spin-on Process
Patent: 6,881,590 →
Application: 10/604,895 →
Publication: US 2005/0048760
Method for Analyzing Final Test Parameters
Patent: 6,898,539 →
Application: 10/604,979 →
Publication: US 2004/0138856
[Split Gate Flash Memory Cell and Manufacturing Method Thereof]
Patent: 6,897,521 →
Application: 10/605,198 →
Publication: US 2005/0006691
[Method for Detecting Defect of Semiconductor Device]
Patent: 6,806,104 →
Application: 10/605,357 →
Method of Improving a Resolution of Contact Hole Patterns by Utilizing Alternate Phase Shift Principle
Patent: 7,008,733 →
Application: 10/605,377 →
Publication: US 2005/0069781
Flash Memory Cell Structure
Patent: 6,963,105 →
Application: 10/605,419 →
Publication: US 2004/0145006
Single-Poly Eprom and Method for Forming the Same
Patent: 6,917,070 →
Application: 10/663,177 →
Publication: US 2004/0053467
Dual-Bit Nitride Read Only Memory Cell with Parasitic Amplifier and Methods of Fabricating and Reading the Same
Patent: 6,757,208 →
Application: 10/665,599 →
Method for Manufacturing Non-Volatile Memory Cell
Patent: 6,869,842 →
Application: 10/707,418 →
Publication: US 2004/0229436
Wafer Grinding Apparatus
Patent: 6,910,956 →
Application: 10/707,561 →
Publication: US 2005/0136809
Management System of Monitor Wafers
Patent: 6,865,434 →
Application: 10/707,626 →
Publication: US 2005/0038544
Fabrication Method of a Flash Memory Device
Patent: 6,855,599 →
Application: 10/707,668 →
Publication: US 2004/0121536
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name Jun 24, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049562/0151 →
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0173 →
Assignment of Assignor's Interest Apr 8, 2020
From: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 052337/0735 →
Assignment of Assignor's Interest Sep 7, 2020
From: POWERCHIP TECHNOLOGY CORPORATION
To: NEXCHIP SEMICONDUCTOR CORPORATION
Reel/Frame 053704/0522 →