IP Library › Granted Patent US 6,806,104
Granted Patent Utility
US 6,806,104 · Confirmation No. 2356

[METHOD FOR DETECTING DEFECT OF SEMICONDUCTOR DEVICE]

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2004-04-19 CTNF Non-Final Rejection 8 View
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Quick Facts
Patent No.
US 6,806,104
App. No.
10/605,357
Filed
2003-09-25
Granted
2004-10-19
Art Unit
2822
PTA
0 days