IP Library Assignment 014085/0870
Patent Assignment
Reel/Frame 014085/0870

Assignment of Assignor's Interest

Recorded: 2003-05-21 Pages: 3
Assignors
ANDO, KAZUNORI
Executed: 2003-05-14
WATANABE, KAZUTOSHI
Executed: 2003-05-14
SHIKAKURA, YOSHITERU
Executed: 2003-05-14
TSUCHIHASHI, MASAKI
Executed: 2003-05-14
YAMAOKA, TAKEHIRO
Executed: 2003-05-14
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI CHIBA, JAPAN
Covered Property (1)
Method of Operating Scanning Probe Microscope
Patent: 6,596,992 →
Application: 10/017,123 →
Publication: US 2002/0088937
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 9, 2005
From: SEIKO INSTRUMENTS INC.
To: SII NANOTECHNOLOGY INC.
Reel/Frame 015711/0053 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →