IP Library › Assignment 014250/0694
Patent Assignment
Reel/Frame 014250/0694

Assignment of Assignor's Interest

Recorded: 2003-07-14 Pages: 5
Assignor
NANODEVICES INCORPORATED
Executed: 2003-06-04
Assignee
VEECO INSTRUMENTS, INC.
100 SUNNYSIDE BLVD., WOODBURY, NEW YORK, 11797
Covered Properties (9)
Afm with Referenced or Differential Height Measurement
Patent: 6,196,061 →
Application: 09/186,742 →
Mechanism for Controlling Flash Light Emission, Camera with the Mechanism, and Its Control Method
Patent: 6,185,374 →
Application: 09/385,904 →
Active Probe for an Atomic Force Microscope and Method of Use Thereof
Patent: 6,530,266 →
Application: 09/476,163 →
AFM with referenced or differential height measurement
Patent: 6,279,389 →
Application: 09/698,919 →
Dynamic Activation for an Atomic Force Microscope and Method of Use Thereof
Patent: 6,672,144 →
Application: 09/904,913 →
Publication: US 2002/0062684
Apparatus and Method to Compensate for Stress in a Microcantilever
Patent: 6,941,823 →
Application: 10/045,438 →
Active Probe for an Atomic Force Microscope and Method of Use Thereof
Patent: 6,810,720 →
Application: 10/310,546 →
Publication: US 2003/0094036
Method of Fabricating a Surface Probing Device and Probing Device Produced Thereby
Patent: 6,886,395 →
Application: 10/345,513 →
Publication: US 2004/0139794
Apparatus and Method for Improving Tuning of a Probe-Based Instrument
Patent: 6,912,893 →
Application: 10/417,506 →
Publication: US 2004/0206165
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 7, 2002
From: LAI, JONATHAN W.; CAVAZOS, HECTOR B.; MINNE, STEPHEN C.; ADDERTON, DENNIS M.
To: NANODEVICES, INC
Reel/Frame 012502/0129 →
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →