IP Library › Assignment 014264/0795
Patent Assignment
Reel/Frame 014264/0795

Assignment of Assignor's Interest

Recorded: 2004-01-15 Pages: 4
Assignors
MENON, SANKARAN M.
Executed: 2003-03-15
BASTO, LUIS A.
Executed: 2003-03-19
DINH, TIEN
Executed: 2003-03-19
TOMAZIN, THOMAS
Executed: 2003-03-20
REVILLA, JUAN G.
Executed: 2003-03-19
Assignees
ANALOG DEVICES, INC.
ONE TECHNOLOGY WAY, P.O. BOX 9106, NORWOOD, MASSACHUSETTS, 02062-9106
INTEL CORPORATION
2200 MISSION COLLEGE BOULEVARD, SANTA CLARA, CALIFORNIA, 95052
Covered Property (1)
Method and Apparatus for Testing Embedded Cores
Patent: 7,313,739 →
Application: 10/335,149 →
Publication: US 2004/0128596
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 11, 2003
From: BASTO, LUIS A.; MENON, SANKARAN M.; DINH, TIEN; TOMAZIN, THOMAS
To: INTEL CORPORATION
Reel/Frame 013574/0026 →
Assignment of Assignor's Interest Feb 9, 2007
From: INTEL CORPORATION
To: ANALOG DEVICES, INC.
Reel/Frame 018891/0599 →