IP Library Assignment 014504/0321
Patent Assignment
Reel/Frame 014504/0321

Assignment of Assignor's Interest

Recorded: 2003-09-22 Pages: 3
Assignors
SHIMIZU, NOBUHIRO
Executed: 2003-09-05
SHIRAKAWABE, YOSHIHARU
Executed: 2003-09-05
TAKAHASHI, HIROSHI
Executed: 2003-09-05
YASUMURO, CHIAKI
Executed: 2003-09-05
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Property (1)
Microprobe and Sample Surface Measuring Apparatus
Patent: 6,664,540 →
Application: 09/778,459 →
Publication: US 2001/0028033
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 9, 2005
From: SEIKO INSTRUMENTS INC.
To: SII NANOTECHNOLOGY INC.
Reel/Frame 015711/0053 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →