IP Library Assignment 014904/0278
Patent Assignment
Reel/Frame 014904/0278

Assignment of Assignor's Interest

Recorded: 2004-07-28 Pages: 3
Assignors
WU, CHIOU-PING
Executed: 2004-07-08
LIN, HSIU-MIN
Executed: 2004-07-08
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Property (1)
[Auto-Recovery Wafer Testing Apparatus and Wafer Testing Method]
Patent: 6,963,213 →
Application: 10/710,670 →
Publication: US 2005/0231190
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 24, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049562/0154 →
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049746/0981 →