IP Library › Assignment 015407/0176
Patent Assignment
Reel/Frame 015407/0176

Assignment of Assignor's Interest

Recorded: 2004-12-01 Pages: 3
Assignors
LIN, LONG-HUI
Executed: 2004-12-01
CHEN, CHIA-YUN
Executed: 2004-12-01
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL, PARK, HSIN-CHU CITY, TAIWAN
Covered Property (1)
Method of Defect Inspection
Patent: 7,382,451 →
Application: 10/904,873 →
Publication: US 2005/0248756
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0240 →
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049747/0017 →