IP Library Assignment 049747/0017
Patent Assignment
Reel/Frame 049747/0017

Assignment of Assignor's Interest

Recorded: 2019-07-14 Pages: 11
Assignor
POWERCHIP TECHNOLOGY CORPORATION
Executed: 2019-06-28
Assignee
POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
NO. 18, LI-HSIN RD. 1, HSINCHU SCIENCE PARK,, HSINCHU, TAIWAN
Covered Properties (20)
Method of Defect Inspection
Patent: 7,382,451 →
Application: 10/904,873 →
Publication: US 2005/0248756
Flash Memory Cell
Patent: 7,109,082 →
Application: 10/905,189 →
Publication: US 2006/0008981
Method of Manufacturing Semiconductor Device
Patent: 7,056,787 →
Application: 10/905,610 →
Publication: US 2005/0233519
Split Gate Flash Memory Cell and Manufacturing Method Thereof
Patent: 7,358,134 →
Application: 10/907,781 →
Publication: US 2006/0234444
Manufacturing Method a Flash Memory Cell Array
Patent: 7,166,513 →
Application: 10/907,829 →
Publication: US 2005/0170579
Flash Memory Cell, Flash Memory Cell Array and Manufacturing Method Thereof
Patent: 7,057,940 →
Application: 10/907,830 →
Publication: US 2005/0169035
Method for Manufacturing Anti-Punch Through Semiconductor Device
Patent: 7,195,982 →
Application: 10/908,379 →
Publication: US 2006/0115955
Device for Processing Discharging Exhaust Gas
Patent: 7,377,964 →
Application: 10/908,774 →
Publication: US 2006/0130660
Method of Forming Contact Hole and Method of Fabricating Semiconductor Device
Patent: 7,098,124 →
Application: 10/908,871 →
Publication: US 2006/0134910
Method of Applying Micro-Protection in Defect Analysis
Patent: 7,115,865 →
Application: 10/908,953 →
Publication: US 2006/0138323
Method of Forming Si Tip by Single Etching Process and Its Application for Forming Floating Gate
Patent: 7,259,051 →
Application: 11/050,963 →
Publication: US 2006/0178011
One-Time Programmable Read Only Memory and Operating Method Thereof
Patent: 7,436,028 →
Application: 11/144,471 →
Publication: US 2006/0097325
Semiconductor Facility
Patent: 7,235,992 →
Application: 11/146,008 →
Publication: US 2005/0270050
Mask Management Method and Bar Code Reading Apparatus Thereof
Patent: 7,389,930 →
Application: 11/148,382 →
Publication: US 2006/0022049
Method of Fabricating a Non-Volatile Memory
Patent: 7,183,158 →
Application: 11/148,851 →
Publication: US 2006/0063329
Non-Volatile Memory Device and Manufacturing Method and Operating Method Thereof
Patent: 7,154,142 →
Application: 11/158,412 →
Publication: US 2006/0145243
P-Channel Nand Flash Memory and Operating Method Thereof
Patent: 7,061,805 →
Application: 11/160,035 →
Publication: US 2006/0098486
Nonvolatile Memory
Patent: 7,462,902 →
Application: 11/160,175 →
Publication: US 2006/0060910
Method for Manufacturing One-Time Electrically Programmable Read Only Memory
Patent: 7,074,674 →
Application: 11/160,176 →
Publication: US 2006/0154418
Multi-Level Memory Cell and Fabricating Method Thereof
Patent: 7,098,109 →
Application: 11/160,523 →
Publication: US 2005/0227443
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0240 →
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0267 →
Assignment of Assignor's Interest Apr 8, 2020
From: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 052337/0735 →
Assignment of Assignor's Interest Sep 7, 2020
From: POWERCHIP TECHNOLOGY CORPORATION
To: NEXCHIP SEMICONDUCTOR CORPORATION
Reel/Frame 053704/0522 →