IP Library Assignment 049629/0267
Patent Assignment
Reel/Frame 049629/0267

Change of Name

Recorded: 2019-06-28 Pages: 3
Assignor
POWERCHIP SEMICONDUCTOR CORP.
Executed: 2010-08-09
Assignee
POWERCHIP TECHNOLOGY CORPORATION
NO. 12, LI-HSIN ROAD 1, HSINCHU SCIENCE PARK,, HSINCHU, TAIWAN
Covered Properties (18)
Manufacturing Method a Flash Memory Cell Array
Patent: 7,166,513 →
Application: 10/907,829 →
Publication: US 2005/0170579
Flash Memory Cell, Flash Memory Cell Array and Manufacturing Method Thereof
Patent: 7,057,940 →
Application: 10/907,830 →
Publication: US 2005/0169035
Device for Processing Discharging Exhaust Gas
Patent: 7,377,964 →
Application: 10/908,774 →
Publication: US 2006/0130660
Method of Forming Contact Hole and Method of Fabricating Semiconductor Device
Patent: 7,098,124 →
Application: 10/908,871 →
Publication: US 2006/0134910
Method of Applying Micro-Protection in Defect Analysis
Patent: 7,115,865 →
Application: 10/908,953 →
Publication: US 2006/0138323
One-Time Programmable Read Only Memory and Operating Method Thereof
Patent: 7,436,028 →
Application: 11/144,471 →
Publication: US 2006/0097325
Semiconductor Facility
Patent: 7,235,992 →
Application: 11/146,008 →
Publication: US 2005/0270050
Mask Management Method and Bar Code Reading Apparatus Thereof
Patent: 7,389,930 →
Application: 11/148,382 →
Publication: US 2006/0022049
Method of Fabricating a Non-Volatile Memory
Patent: 7,183,158 →
Application: 11/148,851 →
Publication: US 2006/0063329
Non-Volatile Memory Device and Manufacturing Method and Operating Method Thereof
Patent: 7,154,142 →
Application: 11/158,412 →
Publication: US 2006/0145243
P-Channel Nand Flash Memory and Operating Method Thereof
Patent: 7,061,805 →
Application: 11/160,035 →
Publication: US 2006/0098486
Nonvolatile Memory
Patent: 7,462,902 →
Application: 11/160,175 →
Publication: US 2006/0060910
Method for Manufacturing One-Time Electrically Programmable Read Only Memory
Patent: 7,074,674 →
Application: 11/160,176 →
Publication: US 2006/0154418
Multi-Level Memory Cell and Fabricating Method Thereof
Patent: 7,098,109 →
Application: 11/160,523 →
Publication: US 2005/0227443
Auto-Recovery Wafer Testing Apparatus and Wafer Testing Method
Patent: 7,164,283 →
Application: 11/160,661 →
Publication: US 2005/0235181
Flash Memory Cell Structure and Operating Method Thereof
Patent: 7,436,707 →
Application: 11/160,693 →
Publication: US 2005/0232016
Flash Memory Cell and Manufacturing Method Thereof
Patent: 7,183,606 →
Application: 11/160,743 →
Publication: US 2005/0255658
Wafer Defect Detection Methods and Systems
Patent: 7,193,698 →
Application: 11/182,798 →
Publication: US 2007/0013900
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049747/0001 →
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049747/0017 →
Assignment of Assignor's Interest Apr 8, 2020
From: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 052337/0735 →
Assignment of Assignor's Interest Sep 7, 2020
From: POWERCHIP TECHNOLOGY CORPORATION
To: NEXCHIP SEMICONDUCTOR CORPORATION
Reel/Frame 053704/0522 →