IP Library › Assignment 049747/0001
Patent Assignment
Reel/Frame 049747/0001

Assignment of Assignor's Interest

Recorded: 2019-07-14 Pages: 11
Assignor
POWERCHIP TECHNOLOGY CORPORATION
Executed: 2019-06-28
Assignee
POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
NO. 18, LI-HSIN RD. 1, HSINCHU SCIENCE PARK,, HSINCHU, TAIWAN
Covered Properties (3)
Auto-Recovery Wafer Testing Apparatus and Wafer Testing Method
Patent: 7,164,283 →
Application: 11/160,661 →
Publication: US 2005/0235181
Flash Memory Cell Structure and Operating Method Thereof
Patent: 7,436,707 →
Application: 11/160,693 →
Publication: US 2005/0232016
Flash Memory Cell and Manufacturing Method Thereof
Patent: 7,183,606 →
Application: 11/160,743 →
Publication: US 2005/0255658
Related Assignments (1)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0267 →