IP Library Assignment 015461/0613
Patent Assignment
Reel/Frame 015461/0613

Assignment of Assignor's Interest

Recorded: 2004-06-15 Pages: 2
Assignor
GOODWIN, FRANCIS
Executed: 2004-03-04
Assignee
INFINEON TECHNOLOGIES RICHMOND, LP
6000 TECHNOLOGY BOULEVARD, SANDSTON, VIRGINIA, 23150
Covered Property (1)
Method of Determining the Overlay Accuracy of Multiple Patterns Formed on a Semiconductor Wafer
Patent: 6,948,149 →
Application: 10/780,884 →
Publication: US 2005/0188342
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 13, 2010
From: INFINEON TECHNOLOGIES RICHMOND, LP
To: QIMONDA AG
Reel/Frame 023792/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 16, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036877/0513 →