IP Library › Assignment 015719/0103
Patent Assignment
Reel/Frame 015719/0103

Assignment of Assignor's Interest

Recorded: 2005-03-02 Pages: 3
Assignors
LINDSTEDT, REIDAR
Executed: 2005-01-11
FUHRMANN, DIRK
Executed: 2005-01-27
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STR. 53, MUNICH, 81669, GERMANY
Covered Property (1)
Method for Testing an Integrated Semiconductor Memory, and Integrated Semiconductor Memory
Patent: 6,963,514 →
Application: 11/017,857 →
Publication: US 2005/0162949
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023853/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 19, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036888/0745 →