IP Library Assignment 015721/0588
Patent Assignment
Reel/Frame 015721/0588

Assignment of Assignor's Interest

Recorded: 2004-08-23 Pages: 2
Assignor
HAN, JAE WON
Executed: 2004-08-21
Assignee
AMAM SEMICONDUCTOR INC.
891-10 DAECHI-DONG, GANGNAM-GU SEOUL, 135-523, KOREA, REPUBLIC OF
Covered Property (1)
Method of Detecting Misalignment of Ion Implantation Area
Patent: 7,122,388 →
Application: 10/923,996 →
Publication: US 2005/0042779
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Dec 23, 2005
From: ANAM SEMICONDUCTOR INC.
To: DONGBUANAM SEMICONDUCTOR INC.
Reel/Frame 017143/0240 →
Change of Name May 15, 2006
From: DONGBUANAM SEMICONDUCTOR INC.
To: DONGBU ELECTRONICS CO., LTD.
Reel/Frame 017616/0966 →