IP Library › Assignment 017143/0240
Patent Assignment
Reel/Frame 017143/0240

Change of Name

Recorded: 2005-12-23 Pages: 5
Assignor
ANAM SEMICONDUCTOR INC.
Executed: 2004-12-21
Assignee
DONGBUANAM SEMICONDUCTOR INC.
891-10 DAECHI-DONG, KANGNAM-KU, SEOUL, KOREA, REPUBLIC OF
Covered Properties (2)
Method of Detecting Misalignment of Ion Implantation Area
Patent: 7,122,388 →
Application: 10/923,996 →
Publication: US 2005/0042779
Semiconductor Device Including Sidewall Floating Gates
Patent: 7,217,973 →
Application: 10/962,818 →
Publication: US 2005/0045942
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 23, 2004
From: HAN, JAE WON
To: AMAM SEMICONDUCTOR INC.
Reel/Frame 015721/0588 →
Assignment of Assignor's Interest Oct 7, 2004
From: JUNG, JIN HYO
To: ANAM SEMICONDUCTOR, INC.
Reel/Frame 015890/0530 →
Change of Name May 15, 2006
From: DONGBUANAM SEMICONDUCTOR INC.
To: DONGBU ELECTRONICS CO., LTD.
Reel/Frame 017616/0966 →
Assignment of Assignor's Interest May 28, 2014
From: DONGBU HITEK CO., LTD.
To: DSS TECHNOLOGY MANAGEMENT, INC.
Reel/Frame 033035/0680 →