IP Library › Assignment 015914/0383
Patent Assignment
Reel/Frame 015914/0383

Assignment of Assignor's Interest

Recorded: 2005-04-19 Pages: 2
Assignor
HAETTY, JENS
Executed: 2005-02-18
Assignee
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1730 NORTH FIRST STREET, SAN JOSE, CALIFORNIA, 95112
Covered Property (1)
Method and Apparatus for Semiconductor Testing Utilizing Dies with Integrated Circuit
Patent: 7,259,579 →
Application: 11/060,737 →
Publication: US 2006/0186907
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 3, 2005
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 015970/0990 →
Assignment of Assignor's Interest Jan 14, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023806/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 21, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036908/0923 →