Patent Assignment
Reel/Frame 016077/0748
Assignment of Assignor's Interest
Recorded: 2004-06-03
Pages: 3
Assignor
SASAKI, MAMORU
Executed: 2004-05-25
Assignee
JAPAN SCIENCE AND TECHNOLOGY AGENCY
1-8 HONCHOU 4-CHOME, KAWAGUCHI-SHI, SAITAMA 332-0012, JAPAN
Covered Property
(1)
Testing Method and Tester for Semiconductor Integrated Circuit Device Comprising High-Speed Input/Output Element
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 18, 2008
From: JAPAN SCIENCE AND TECHNOLOGY AGENCY
To: HIROSHIMA UNIVERSITY
Reel/Frame 020817/0396 →
Assignment of Assignor's Interest
Oct 19, 2008
From: HIROSHIMA UNIVERSITY
To: INTELLECTUAL VENTURES FUND 35 LLC
Reel/Frame 021691/0922 →
Merger
Sep 8, 2015
From: INTELLECTUAL VENTURES FUND 35 LLC
To: XYLON LLC
Reel/Frame 036563/0846 →