Patent Assignment
Reel/Frame 020817/0396
Assignment of Assignor's Interest
Recorded: 2008-04-18
Pages: 2
Assignor
JAPAN SCIENCE AND TECHNOLOGY AGENCY
Executed: 2008-03-19
Assignee
HIROSHIMA UNIVERSITY
3-2, KAGAMIYAMA 1 CHOME, HIGASHI-HIROSHIMA-SHI, HIROSHIMA, 739-8511, JAPAN
Covered Property
(1)
Testing Method and Tester for Semiconductor Integrated Circuit Device Comprising High-Speed Input/Output Element
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 3, 2004
From: SASAKI, MAMORU
To: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 016077/0748 →
Assignment of Assignor's Interest
Oct 19, 2008
From: HIROSHIMA UNIVERSITY
To: INTELLECTUAL VENTURES FUND 35 LLC
Reel/Frame 021691/0922 →
Merger
Sep 8, 2015
From: INTELLECTUAL VENTURES FUND 35 LLC
To: XYLON LLC
Reel/Frame 036563/0846 →