IP Library › Assignment 016084/0480
Patent Assignment
Reel/Frame 016084/0480

Assignment of Assignor's Interest

Recorded: 2005-06-01 Pages: 3
Assignors
CHANG, CHING-PIN
Executed: 2005-02-16
SHIH, CHING-CHING
Executed: 2005-02-16
CHEN, TING-WEI
Executed: 2005-02-16
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE PARK, HSIN-CHU CITY, TAIWAN
Covered Property (1)
Method of Applying Micro-Protection in Defect Analysis
Patent: 7,115,865 →
Application: 10/908,953 →
Publication: US 2006/0138323
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0267 →
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049747/0017 →