Assignment of Assignor's Interest

Recorded: 2005-06-13 Pages: 3

Assignor

KLINE, MR. JERRY D.

Executed: 2000-08-24

Assignee

MICRO-ASI, INC.

12655 N. CENTRAL EXPRESSWAY, SUITE 1000, DALLAS, TEXAS, 75243

Covered Property (1)

System for Testing Semiconductor Die on Multiple Semiconductor Wafers

Patent: 6,927,593 →

Application: 10/860,679 →

Publication: US 2004/0217772

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.