Patent Assignment
Reel/Frame 016138/0853
Assignment of Assignor's Interest
Recorded: 2005-01-07
Pages: 3
Assignor
BUCKSCH, THORSTEN
Executed: 2004-11-22
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STR. 53, 81669 MUNCHEN, GERMANY
Covered Property
(1)
Signal Test Procedure for Testing Semi-Conductor Components and a Test Apparatus for Testing Semi-Conductor Components
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 25, 2004
From: AGRAHARA, ARAVIND C.
To: CIRRUS LOGIC, INC.
Reel/Frame 015920/0106 →
Assignment of Assignor's Interest
Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023853/0001 →
Assignment of Assignor's Interest
May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest
Oct 16, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036877/0513 →