IP Library › Assignment 016620/0676
Patent Assignment
Reel/Frame 016620/0676

Assignment of Assignor's Interest

Recorded: 2005-10-05 Pages: 2
Assignors
SCHNEIDER, PETER
Executed: 2004-11-16
NIERLE, KLAUS
Executed: 2004-11-16
Assignee
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1730 NORTH FIRST STREET, SAN JOSE, CALIFORNIA, 95112
Covered Property (1)
Method for Full Wafer Contact Probing, Wafer Design and Probe Card Device with Reduced Probe Contacts
Patent: 7,157,923 →
Application: 10/990,420 →
Publication: US 2006/0103401
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 14, 2005
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 016642/0699 →
Assignment of Assignor's Interest Jan 14, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023806/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 21, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036908/0923 →