IP Library Assignment 016763/0761
Patent Assignment
Reel/Frame 016763/0761

Assignment of Assignor's Interest

Recorded: 2005-07-18 Pages: 2
Assignors
LIN, LONG-HUI
Executed: 2005-06-23
CHAN, LI-YU
Executed: 2005-06-23
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, R.O.C., TAIWAN
Covered Property (1)
Wafer Defect Detection Methods and Systems
Patent: 7,193,698 →
Application: 11/182,798 →
Publication: US 2007/0013900
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0267 →
Change of Name Jul 16, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049757/0536 →