IP Library Assignment 049757/0536
Patent Assignment
Reel/Frame 049757/0536

Change of Name

Recorded: 2019-07-16 Pages: 11
Assignor
POWERCHIP TECHNOLOGY CORPORATION
Executed: 2019-06-28
Assignee
POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
NO. 18, LI-HSIN RD. 1, HSINCHU SCIENCE PARK,, HSINCHU, TAIWAN
Covered Properties (20)
Method for Fabricating Semiconductor Device
Patent: 7,354,851 →
Application: 11/161,080 →
Publication: US 2006/0166499
Method for Forming Trench Gate Dielectric Layer
Patent: 7,205,217 →
Application: 11/161,177 →
Publication: US 2006/0160306
Non-Volatile Memory and Manufacturing and Operating Method Thereof
Patent: 7,391,078 →
Application: 11/161,398 →
Publication: US 2006/0170038
Method of Fabricating Non-Volatile Memory
Patent: 7,166,512 →
Application: 11/161,648 →
Publication: US 2006/0199333
Flash Memory
Patent: 7,196,371 →
Application: 11/161,994 →
Publication: US 2006/0175654
Non-Volatile Memory Including Assist Gate
Patent: 7,528,438 →
Application: 11/162,035 →
Publication: US 2006/0186459
Method for Manufacturing Semiconductor Devices and Plug
Patent: 7,368,373 →
Application: 11/162,081 →
Publication: US 2006/0183311
Method of Fabricating Non-Volatile Memory
Patent: 7,144,774 →
Application: 11/162,082 →
Method of Fabricating Conductive Lines with Silicide Layer
Patent: 7,550,372 →
Application: 11/162,115 →
Publication: US 2006/0166497
Non-Volatile Memory and Fabricating Method and Operating Method Thereof
Patent: 7,274,062 →
Application: 11/162,116 →
Publication: US 2006/0170026
Wafer Measuring Fixture
Patent: 7,431,260 →
Application: 11/162,273 →
Publication: US 2007/0051191
Method of Operating P-Channel Memory
Patent: 7,200,040 →
Application: 11/162,365 →
Publication: US 2006/0215460
Non-Volatile Memory Structure and Method of Fabricating Non-Volatile Memory
Patent: 7,391,073 →
Application: 11/162,497 →
Publication: US 2006/0172491
Non-Volatile Memory Device
Patent: 7,442,998 →
Application: 11/162,648 →
Publication: US 2006/0234446
Wafer Defect Detection Methods and Systems
Patent: 7,193,698 →
Application: 11/182,798 →
Publication: US 2007/0013900
Methods for Determining Tool Assignment Preference and Manufacturing Systems Using the Same
Patent: 7,292,903 →
Application: 11/184,793 →
Publication: US 2006/0195209
Methods and Systems for Semiconductor Defect Detection
Patent: 7,254,759 →
Application: 11/203,236 →
Publication: US 2006/0143550
Method of Piping Defect Detection
Patent: 7,442,561 →
Application: 11/207,895 →
Publication: US 2006/0183256
Inspection Methods for a Semiconductor Device
Patent: 7,132,354 →
Application: 11/213,931 →
Publication: US 2006/0134812
Real-Time Management Systems and Methods for Manufacturing Management and Yield Rate Analysis Integration
Patent: 7,260,444 →
Application: 11/228,361 →
Publication: US 2006/0241802
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name Jun 27, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049623/0635 →
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0267 →
Assignment of Assignor's Interest Apr 8, 2020
From: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 052337/0735 →
Assignment of Assignor's Interest Sep 7, 2020
From: POWERCHIP TECHNOLOGY CORPORATION
To: NEXCHIP SEMICONDUCTOR CORPORATION
Reel/Frame 053704/0522 →