IP Library Assignment 016955/0259
Patent Assignment
Reel/Frame 016955/0259

Assignment of Assignor's Interest

Recorded: 2005-12-29 Pages: 3
Assignor
WAN, DER-SHEN
Executed: 2005-11-29
Assignee
VEECO INSTRUMENTS INC.
2650 E. ELVIRA ROAD, TUCSON, ARIZONA, 85706
Covered Property (1)
Measurement of Thin Films Using Fourier Amplitude
Patent: 7,612,891 →
Application: 11/300,945 →
Publication: US 2007/0139656
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO INC.
Reel/Frame 028350/0420 →