IP Library › Assignment 017445/0707
Patent Assignment
Reel/Frame 017445/0707

Assignment of Assignor's Interest

Recorded: 2006-01-09 Pages: 3
Assignors
BUCKSCH, THORSTEN
Executed: 2005-11-28
MEIER, MARTIN
Executed: 2005-11-28
Assignee
INFINEON TECHNOLOGIES AG
ST-MARTIN-STR. 53, MUNCHEN, 81669, GERMANY
Covered Property (1)
Semi-Conductor Component Test Device, in Particular Data Buffer Component with Semi-Conductor Component Test Device, as Well as Semi-Conductor Component Test Procedure
Patent: 7,421,629 →
Application: 11/253,814 →
Publication: US 2006/0107155
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 14, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023806/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest Oct 21, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036908/0923 →