IP Library › Assignment 017822/0586
Patent Assignment
Reel/Frame 017822/0586

Change of Address

Recorded: 2006-04-26 Pages: 2
Assignor
NANOGEOMETRY RESEARCH INC.
Executed: 2006-03-01
Assignee
NANOGEOMETRY RESEARCH INC.
#303 2-9-6 NAGATA-CHO, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Inspection Apparatus and Method
Patent: 7,817,844 →
Application: 11/058,616 →
Publication: US 2005/0146714
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 16, 2005
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARACH INC.
Reel/Frame 016280/0588 →
Change of Name Nov 16, 2010
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 025376/0162 →
Change of Address Oct 30, 2017
From: NGR INC.
To: NGR INC.
Reel/Frame 044324/0817 →
Change of Name Jan 14, 2020
From: NGR INC.
To: TASMIT, INC.
Reel/Frame 051590/0962 →