IP Library › Assignment 051590/0962
Patent Assignment
Reel/Frame 051590/0962

Change of Name

Recorded: 2020-01-14 Pages: 6
Assignor
NGR INC.
Executed: 2019-12-03
Assignee
TASMIT, INC.
2-6-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA, KANAGAWA, YOKOHAMA, 222-0033, JAPAN
Covered Properties (18)
Pattern Inspection Apparatus and Method
Patent: 7,817,844 →
Application: 11/058,616 →
Publication: US 2005/0146714
Pattern Inspection Apparatus and Method
Patent: 7,796,801 →
Application: 11/434,797 →
Publication: US 2006/0245636
Pattern Inspection Apparatus and Method
Patent: 7,983,471 →
Application: 11/987,766 →
Publication: US 2008/0130982
Defect and Critical Dimension Analysis Systems and Methods for a Semiconductor Lithographic Process
Patent: 8,422,761 →
Application: 12/637,331 →
Publication: US 2010/0158345
System and Method for a Semiconductor Lithographic Process Control Using Statistical Information in Defect Identification
Patent: 8,150,140 →
Application: 12/725,141 →
Publication: US 2010/0215247
Pattern Inspection Apparatus and Method
Patent: 8,045,785 →
Application: 12/852,314 →
Publication: US 2010/0303334
Pattern Inspection Apparatus and Method
Patent: 8,285,031 →
Application: 13/152,227 →
Publication: US 2011/0235895
Secondary Particle Detection System of Scanning Electron Microscope
Application: 15/071,526 →
Publication: US 2017/0271124
Image Generation Apparatus
Patent: 9,793,091 →
Application: 15/195,136 →
Pattern Inspection Method and Pattern Inspection Apparatus
Application: 15/195,145 →
Publication: US 2017/0372464
Method Of Utilizing Information On Shape Of Frequency Distribution Of Inspection Result In A Pattern Inspection Apparatus
Application: 15/196,218 →
Publication: US 2018/0005366
Method And Apparatus For Integrated Circuit Pattern Inspection With Automatically Set Inspection Areas
Application: 15/486,251 →
Publication: US 2018/0300872
Method of Visualizing Defect Using Design Data and Defect Detection Method
Application: 16/009,660 →
Publication: US 2019/0026881
Imaging System and Imaging Method
Application: 16/011,006 →
Publication: US 2019/0019651
Pattern Defect Detection Method
Application: 16/013,232 →
Publication: US 2019/0025371
Pattern Edge Detection Method
Application: 16/018,810 →
Publication: US 2019/0005650
Method of Verifying Operation Parameter of Scanning Electron Microscope
Application: 16/021,017 →
Publication: US 2019/0006145
Image Generation Method
Application: 16/116,700 →
Publication: US 2019/0066971
Related Assignments (24)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 16, 2005
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARACH INC.
Reel/Frame 016280/0588 →
Change of Address Apr 26, 2006
From: NANOGEOMETRY RESEARCH INC.
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 017822/0586 →
Assignment of Assignor's Interest Jun 28, 2006
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 018016/0261 →
Assignment of Assignor's Interest Dec 4, 2007
From: KITAMURA, TADASHI; HASEBE, TOSHIAKI; TSUNEOKA, MASATOSHI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 020251/0525 →
Assignment of Assignor's Interest Dec 14, 2009
From: KITAMURA, TADASHI; ISHIKAWA, AKIO
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 023651/0404 →
Assignment of Assignor's Interest May 11, 2010
From: KITAMURA, TADASHI; ISHIKAWA, AKIO
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 024368/0587 →
Change of Name Nov 16, 2010
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 025376/0162 →
Change of Name Feb 16, 2011
From: NANOGEOMETRY RESEARCH INC.
To: NGR INC.
Reel/Frame 025821/0399 →
Assignment of Assignor's Interest Feb 16, 2011
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 025821/0367 →
Assignment of Assignor's Interest Jun 13, 2011
From: KITAMURA, TADASHI; HASEBE, TOSHIAKI; TSUNEOKA, MASATOSHI
To: NANOGEOMETRY RESEARCH, INC.
Reel/Frame 026434/0540 →
Assignment of Assignor's Interest Jun 13, 2011
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 026434/0439 →
Assignment of Assignor's Interest Jun 7, 2016
From: SASAKI, SUMIO; TAKASHIMA, SUSUMU; KATO, MAKOTO; KUBOTA, KAZUFUMI
To: NGR INC.
Reel/Frame 038836/0139 →
Assignment of Assignor's Interest Sep 14, 2016
From: TESHIMA, HIDEAKI; KUBOTA, KAZUFUMI; SATO, EIJI; SATO, SHIGEYUKI
To: NGR INC.
Reel/Frame 039742/0095 →
Assignment of Assignor's Interest Oct 13, 2016
From: SATO, YOSHISHIGE
To: NGR INC.
Reel/Frame 040006/0670 →
Assignment of Assignor's Interest Oct 24, 2016
From: KITAMURA, TADASHI
To: NGR INC.
Reel/Frame 040101/0416 →
Assignment of Assignor's Interest May 17, 2017
From: TANAKA, KAZUTO; TERASAKI, SATOSHI
To: NGR INC.
Reel/Frame 042417/0243 →
Change of Address Oct 30, 2017
From: NGR INC.
To: NGR INC.
Reel/Frame 044324/0817 →
Assignment of Assignor's Interest Jun 15, 2018
From: SATO, YOSHISHIGE
To: NGR INC.
Reel/Frame 046105/0470 →
Assignment of Assignor's Interest Jun 20, 2018
From: SHIMODA, RYO
To: NGR INC.
Reel/Frame 046152/0165 →
Assignment of Assignor's Interest Jun 26, 2018
From: OYA, MASAHIRO
To: NGR INC.
Reel/Frame 046204/0956 →
Assignment of Assignor's Interest Jun 28, 2018
From: KANEKO, KOJI
To: NGR INC.
Reel/Frame 046228/0241 →
Assignment of Assignor's Interest Aug 10, 2018
From: MARUYAMA, KOTARO
To: NGR INC.
Reel/Frame 046609/0614 →
Assignment of Assignor's Interest Aug 29, 2018
From: NAKAZAWA, SHINICHI
To: NGR INC.
Reel/Frame 046745/0007 →
Assignment of Assignor's Interest Sep 2, 2020
From: MARUYAMA, KOTARO
To: TASMIT, INC.
Reel/Frame 053670/0123 →