IP Library › Assignment 044324/0817
Patent Assignment
Reel/Frame 044324/0817

Change of Address

Recorded: 2017-10-30 Pages: 3
Assignor
NGR INC.
Executed: 2017-10-23
Assignee
NGR INC.
KANEKO NO. 2 BUILDING, 2-6-23 SHIN-YOKOHAMA, KOHOKU-KU, KANAGAWA, YOKOHAMA, 222-0033, JAPAN
Covered Properties (16)
Pattern Inspection Apparatus, Pattern Inspection Method, and Recording Medium
Patent: 6,868,175 →
Application: 09/648,372 →
Pattern Inspection Apparatus, Pattern Inspection Method, and Recording Medium
Patent: 7,660,455 →
Application: 11/044,159 →
Publication: US 2005/0226494
Pattern Inspection Apparatus and Method
Patent: 7,817,844 →
Application: 11/058,616 →
Publication: US 2005/0146714
Pattern Inspection Apparatus and Method
Patent: 7,796,801 →
Application: 11/434,797 →
Publication: US 2006/0245636
Pattern Inspection Apparatus and Method
Patent: 7,983,471 →
Application: 11/987,766 →
Publication: US 2008/0130982
Defect and Critical Dimension Analysis Systems and Methods for a Semiconductor Lithographic Process
Patent: 8,422,761 →
Application: 12/637,331 →
Publication: US 2010/0158345
System and Method for a Semiconductor Lithographic Process Control Using Statistical Information in Defect Identification
Patent: 8,150,140 →
Application: 12/725,141 →
Publication: US 2010/0215247
Pattern Inspection Apparatus and Method
Patent: 8,045,785 →
Application: 12/852,314 →
Publication: US 2010/0303334
Pattern Inspection Apparatus and Method
Patent: 8,285,031 →
Application: 13/152,227 →
Publication: US 2011/0235895
Pattern Inspection Apparatus and Method
Patent: 9,189,843 →
Application: 13/604,456 →
Publication: US 2012/0328181
Secondary Particle Detection System of Scanning Electron Microscope
Application: 15/071,526 →
Publication: US 2017/0271124
Image Generation Apparatus
Patent: 9,793,091 →
Application: 15/195,136 →
Pattern Inspection Method and Pattern Inspection Apparatus
Application: 15/195,145 →
Publication: US 2017/0372464
Method Of Utilizing Information On Shape Of Frequency Distribution Of Inspection Result In A Pattern Inspection Apparatus
Application: 15/196,218 →
Publication: US 2018/0005366
Scanning Electron Microscope
Application: 15/196,507 →
Publication: US 2018/0005797
Method And Apparatus For Integrated Circuit Pattern Inspection With Automatically Set Inspection Areas
Application: 15/486,251 →
Publication: US 2018/0300872
Related Assignments (22)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 3, 2004
From: KITAMURA, TADASHI
To: NANOGEOMETRY RESEARCH
Reel/Frame 015758/0185 →
Assignment of Assignor's Interest Feb 16, 2005
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARACH INC.
Reel/Frame 016280/0588 →
Change of Address Apr 26, 2006
From: NANOGEOMETRY RESEARCH INC.
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 017822/0586 →
Assignment of Assignor's Interest Apr 26, 2006
From: YAMAMOTO, MASAHIRO; KITAMURA, TADASHI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 017990/0192 →
Assignment of Assignor's Interest Jun 28, 2006
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 018016/0261 →
Corrective Assignment to Add an Omitted Assignor and to Correct the Assignee's Name and Address Previously Recorded on Reel 15758 Frame 0185. Assignor Confirms the Assignment. Jul 24, 2006
From: YAMAMOTO, MASAHIRO; KITAMURA, TADASHI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 018000/0167 →
Assignment of Assignor's Interest Dec 4, 2007
From: KITAMURA, TADASHI; HASEBE, TOSHIAKI; TSUNEOKA, MASATOSHI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 020251/0525 →
Assignment of Assignor's Interest Dec 14, 2009
From: KITAMURA, TADASHI; ISHIKAWA, AKIO
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 023651/0404 →
Assignment of Assignor's Interest May 11, 2010
From: KITAMURA, TADASHI; ISHIKAWA, AKIO
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 024368/0587 →
Change of Name Nov 16, 2010
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 025376/0162 →
Assignment of Assignor's Interest Feb 16, 2011
From: KITAMURA, TADASHI; KUBOTA, KAZUFUMI; NAKAZAWA, SHINICHI; VOHRA, NEETI
To: NANOGEOMETRY RESEARCH INC.
Reel/Frame 025821/0367 →
Change of Name Feb 16, 2011
From: NANOGEOMETRY RESEARCH INC.
To: NGR INC.
Reel/Frame 025821/0399 →
Assignment of Assignor's Interest Jun 13, 2011
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 026434/0439 →
Assignment of Assignor's Interest Jun 13, 2011
From: KITAMURA, TADASHI; HASEBE, TOSHIAKI; TSUNEOKA, MASATOSHI
To: NANOGEOMETRY RESEARCH, INC.
Reel/Frame 026434/0540 →
Assignment of Assignor's Interest Jun 7, 2016
From: SASAKI, SUMIO; TAKASHIMA, SUSUMU; KATO, MAKOTO; KUBOTA, KAZUFUMI
To: NGR INC.
Reel/Frame 038836/0139 →
Assignment of Assignor's Interest Sep 14, 2016
From: TESHIMA, HIDEAKI; KUBOTA, KAZUFUMI; SATO, EIJI; SATO, SHIGEYUKI
To: NGR INC.
Reel/Frame 039742/0095 →
Assignment of Assignor's Interest Oct 13, 2016
From: SATO, YOSHISHIGE
To: NGR INC.
Reel/Frame 040006/0670 →
Assignment of Assignor's Interest Oct 13, 2016
From: KATO, MAKOTO; TAKASHIMA, SUSUMU; KUBOTA, KAZUFUMI; ZENYOUJI, KAORU
To: NGR INC.
Reel/Frame 040006/0516 →
Assignment of Assignor's Interest Oct 24, 2016
From: KITAMURA, TADASHI
To: NGR INC.
Reel/Frame 040101/0416 →
Assignment of Assignor's Interest May 17, 2017
From: TANAKA, KAZUTO; TERASAKI, SATOSHI
To: NGR INC.
Reel/Frame 042417/0243 →
Change of Name Jan 14, 2020
From: NGR INC.
To: TASMIT, INC.
Reel/Frame 051590/0962 →
Change of Name Feb 6, 2020
From: NGR INC.
To: TASMIT, INC.
Reel/Frame 051835/0775 →