Patent Assignment
Reel/Frame 023651/0404
Assignment of Assignor's Interest
Recorded: 2009-12-14
Pages: 3
Assignee
NANOGEOMETRY RESEARCH INC.
#303, 2-9-6 NAGATA-CHO, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Defect and Critical Dimension Analysis Systems and Methods for a Semiconductor Lithographic Process
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.