IP Library › Assignment 024368/0587
Patent Assignment
Reel/Frame 024368/0587

Assignment of Assignor's Interest

Recorded: 2010-05-11 Pages: 4
Assignors
KITAMURA, TADASHI
Executed: 2010-03-17
ISHIKAWA, AKIO
Executed: 2010-03-17
Assignee
NANOGEOMETRY RESEARCH INC.
7F NK SHIMURASAKAUE BLDG, 3-6-7 AZUSAWA, ITABASHI-KU, TOKYO, 174-0051, JAPAN
Covered Property (1)
System and Method for a Semiconductor Lithographic Process Control Using Statistical Information in Defect Identification
Patent: 8,150,140 →
Application: 12/725,141 →
Publication: US 2010/0215247
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 16, 2010
From: NANOGEOMETRY RESEARCH, INC.
To: NGR INC.
Reel/Frame 025376/0162 →
Change of Address Oct 30, 2017
From: NGR INC.
To: NGR INC.
Reel/Frame 044324/0817 →
Change of Name Jan 14, 2020
From: NGR INC.
To: TASMIT, INC.
Reel/Frame 051590/0962 →