Method of verifying operation parameter of scanning electron microscope
A method capable of verifying whether operation parameters, such as a focus parameter and an astigmatism correction parameter, of a scanning electron microscope are correctly adjusted. This method includes: determining a ratio of a length of an edge in a first direction to a length of the edge in a second direction perpendicular to the first direction, the edge being an edge of a pattern selected from design data; generating images of the pattern while changing an operation parameter of a scanning electron microscope; calculating an edge sharpness in the first direction of each of the images and calculating an edge sharpness in the second direction of each of the images; determining a ratio of a peak value of the edge sharpness in the first direction to a peak value of the edge sharpness in the second direction; and emitting an alarm if the ratio of the peak values does not coincide with the ratio of the lengths of the edge.
1. A method of verifying an operation parameter of a scanning electron microscope, comprising:
calculating a first length of an edge in a first direction and a second length of the edge in a second direction from dimensions of a pattern selected from design data for a wafer the dimensions being contained in the design data, the second direction being perpendicular to the first direction;
determining a ratio of the first length to the second length;
generating images of a shape on the wafer corresponding to the pattern while changing the operation parameter of the scanning electron microscope;
calculating an edge sharpness in the first direction of each of the images and calculating an edge sharpness in the second direction of the shape in each of the images;
determining a ratio of a peak value of the edge sharpness in the first direction to a peak value of the edge sharpness in the second direction; and
emitting an alarm from a computer if the ratio of the peak values does not coincide with the ratio of the first length to the second length.
2. The method according to claim 1 , further comprising:
applying corner-rounding process to the pattern.
3. The method according to claim 1 , wherein the operation parameter is one of a focus parameter, an astigmatism correction parameter, and a lens alignment correction parameter.