Patent Assignment
Reel/Frame 018087/0088
Corrective Assignment to Correct Assignee's Name and Address, Previousl Yrecorded on 04-02-03 at Reel 013940/Frame 0320
Recorded: 2006-07-13
Pages: 4
Assignors
PENG, JACK ZEZHONG
Executed: 2003-04-01
LUAN, HARRY SHENGWEN
Executed: 2003-04-01
WANG, JIANGUO
Executed: 2003-04-01
LIU, ZHONGSHANG
Executed: 2003-04-01
FONG, DAVID
Executed: 2003-04-01
YE, FEI
Executed: 2003-04-01
Assignee
KILOPASS TECHNOLOGY, INC.
3333 OCTAVIUS DRIVE, SUITE 101, SANTA CLARA, CALIFORNIA, 95054
Covered Property
(1)
Method of Testing the Thin Oxide of a Semiconductor Memory Cell That Uses Breakdown Voltage
Patent:
6,791,891 →
Application:
10/406,406 →
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 2, 2003
From: PENG, JACK ZEZHONG; LUAN, HARRY SHENGWEN; WANG, JIANGUO; LIU, ZHONGSHAN
To: KILOPASS TECHNOLOGIES, INC.
Reel/Frame 013940/0320 →
Security Interest
Aug 30, 2016
From: KILOPASS TECHNOLOGY, INC.
To: STRUCTURAL CAPITAL INVESTMENTS II, LP
Reel/Frame 039884/0004 →
Assignment of Assignor's Interest
May 4, 2018
From: KILOPASS TECHNOLOGY, INC.
To: SYNOPSYS, INC.
Reel/Frame 046099/0269 →