IP Library Assignment 018549/0045
Patent Assignment
Reel/Frame 018549/0045

Assignment of Assignor's Interest

Recorded: 2006-11-17 Pages: 2
Assignor
NEOCERA, INC.
Executed: 2006-11-16
Assignee
NEOCERA, LLC
10000 VIRGINIA MANOR ROAD, SUITE 300, BELTSVILLE, MARYLAND, 20705-4215
Covered Property (1)
Method and System for Measurement of Dielectric Constant of Thin Films Using a Near Field Microwave Probe
Patent: 7,285,963 →
Application: 11/101,517 →
Publication: US 2005/0230619
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 20, 2005
From: TALANOV, VLADIMIR V.; SCHWARTZ, ANDREW R.; SCHERZ, ANDRE; MORELAND, ROBERT L.
To: NEOCERA, INC.
Reel/Frame 016114/0071 →
Assignment of Assignor's Interest Mar 13, 2007
From: NEOCERA, LLC
To: SOLID STATE MEASUREMENTS, INC.
Reel/Frame 019002/0317 →
Assignment of Assignor's Interest Apr 8, 2013
From: SOLID STATE MEASUREMENTS, INC.
To: SEMICONDUCTOR PHYSICS LABORATORY, INC.
Reel/Frame 030172/0092 →