Patent Assignment
Reel/Frame 019002/0317
Assignment of Assignor's Interest
Recorded: 2007-03-13
Pages: 5
Assignor
NEOCERA, LLC
Executed: 2006-11-16
Assignee
SOLID STATE MEASUREMENTS, INC.
110 TECHNOLOGY DRIVE, PITTSBURGH, PENNSYLVANIA, 15275
Covered Properties
(2)
Method and System for Measurement of Dielectric Constant of Thin Films Using a Near Field Microwave Probe
Method and System for Measurement of Sidewall Damage in Etched Dielectric Structures Using a Near Field Microwave Probe
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 20, 2005
From: TALANOV, VLADIMIR V.; SCHWARTZ, ANDREW R.; SCHERZ, ANDRE; MORELAND, ROBERT L.
To: NEOCERA, INC.
Reel/Frame 016114/0071 →
Assignment of Assignor's Interest
Oct 25, 2005
From: TALANOV, VLADIMIR V.; SCHWARTZ, ANDREW R.; SCHERZ, ANDRE
To: NEOCERA, INC.
Reel/Frame 016936/0691 →
Assignment of Assignor's Interest
Nov 17, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018548/0542 →
Assignment of Assignor's Interest
Nov 17, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018549/0045 →
Record the Correct Serial Number 11/294705 of the for the Application, Previously Recorded on Reel 18548/Frame 542.
Dec 7, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018614/0708 →
Assignment of Assignor's Interest
Apr 8, 2013
From: SOLID STATE MEASUREMENTS, INC.
To: SEMICONDUCTOR PHYSICS LABORATORY, INC.
Reel/Frame 030172/0092 →