IP Library › Assignment 018614/0708
Patent Assignment
Reel/Frame 018614/0708

Record the Correct Serial Number 11/294705 of the for the Application, Previously Recorded on Reel 18548/Frame 542.

Recorded: 2006-12-07 Pages: 4
Assignor
NEOCERA, INC.
Executed: 2006-11-16
Assignee
NEOCERA, LLC
10000 VIRGINIA MANOR ROAD, SUITE 300, BELTSVILLE, MARYLAND, 20705-4215
Covered Property (1)
Method and System for Measurement of Sidewall Damage in Etched Dielectric Structures Using a Near Field Microwave Probe
Patent: 7,362,108 →
Application: 11/249,705 →
Publication: US 2006/0087305
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 25, 2005
From: TALANOV, VLADIMIR V.; SCHWARTZ, ANDREW R.; SCHERZ, ANDRE
To: NEOCERA, INC.
Reel/Frame 016936/0691 →
Assignment of Assignor's Interest Nov 17, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018548/0542 →
Assignment of Assignor's Interest Mar 13, 2007
From: NEOCERA, LLC
To: SOLID STATE MEASUREMENTS, INC.
Reel/Frame 019002/0317 →
Assignment of Assignor's Interest Apr 8, 2013
From: SOLID STATE MEASUREMENTS, INC.
To: SEMICONDUCTOR PHYSICS LABORATORY, INC.
Reel/Frame 030172/0092 →