IP Library › Assignment 016936/0691
Patent Assignment
Reel/Frame 016936/0691

Assignment of Assignor's Interest

Recorded: 2005-10-25 Pages: 2
Assignors
TALANOV, VLADIMIR V.
Executed: 2005-10-12
SCHWARTZ, ANDREW R.
Executed: 2005-10-12
SCHERZ, ANDRE
Executed: 2005-10-12
Assignee
NEOCERA, INC.
10000 VIRGINIA MANOR ROAD, SUITE 300, BELTSVILLE, MARYLAND, 20705-4215
Covered Property (1)
Method and System for Measurement of Sidewall Damage in Etched Dielectric Structures Using a Near Field Microwave Probe
Patent: 7,362,108 →
Application: 11/249,705 →
Publication: US 2006/0087305
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 17, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018548/0542 →
Record the Correct Serial Number 11/294705 of the for the Application, Previously Recorded on Reel 18548/Frame 542. Dec 7, 2006
From: NEOCERA, INC.
To: NEOCERA, LLC
Reel/Frame 018614/0708 →
Assignment of Assignor's Interest Mar 13, 2007
From: NEOCERA, LLC
To: SOLID STATE MEASUREMENTS, INC.
Reel/Frame 019002/0317 →
Assignment of Assignor's Interest Apr 8, 2013
From: SOLID STATE MEASUREMENTS, INC.
To: SEMICONDUCTOR PHYSICS LABORATORY, INC.
Reel/Frame 030172/0092 →