IP Library Assignment 018603/0096
Patent Assignment
Reel/Frame 018603/0096

Assignment of Assignor's Interest

Recorded: 2006-11-14 Pages: 2
Assignors
JEON, YOON-CHEOL
Executed: 2006-11-03
KIM, TAE-YONG
Executed: 2006-11-03
Assignee
SAMSUNG SDI CO., LTD.
575, SHIN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 442-731, KOREA, REPUBLIC OF
Covered Property (1)
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus
Patent: 8,263,934 →
Application: 11/958,625 →
Publication: US 2009/0272899
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 7, 2008
From: YAMAZAKI, MINORU; IKEGAMI, AKIRA; KAZUMI, HIDEYUKI; NASU, OSAMU
To: HITACHI HIGH-TECHNOLOGIES CORPOARTION
Reel/Frame 020616/0719 →
Corrective Assignment to Correct Assignee's Name Previously Recorded on Reel 020616 and Frame 0719 Jun 16, 2008
From: YAMAZAKI, MINORU; IKEGAMI, AKIRA; KAZUMI, HIDEYUKI; NASU, OSAMU
To: HITACHI-HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 021103/0302 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →