Patent Assignment
Reel/Frame 020616/0719
Assignment of Assignor's Interest
Recorded: 2008-03-07
Pages: 2
Assignors
YAMAZAKI, MINORU
Executed: 2008-01-21
IKEGAMI, AKIRA
Executed: 2008-01-29
KAZUMI, HIDEYUKI
Executed: 2008-01-21
NASU, OSAMU
Executed: 2008-01-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPOARTION
1-24-14, NISHI SHINBASHI, MINATO-KU TOKYO, JAPAN
Covered Property
(1)
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Nov 14, 2006
From: JEON, YOON-CHEOL; KIM, TAE-YONG
To: SAMSUNG SDI CO., LTD.
Reel/Frame 018603/0096 →
Corrective Assignment to Correct Assignee's Name Previously Recorded on Reel 020616 and Frame 0719
Jun 16, 2008
From: YAMAZAKI, MINORU; IKEGAMI, AKIRA; KAZUMI, HIDEYUKI; NASU, OSAMU
To: HITACHI-HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 021103/0302 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →