IP Library › Assignment 019355/0652
Patent Assignment
Reel/Frame 019355/0652

Assignment of Assignor's Interest

Recorded: 2007-05-30 Pages: 3
Assignors
WERNER, THOMAS
Executed: 2007-01-25
FEUSTEL, FRANK
Executed: 2007-01-29
FROHBERG, KAI
Executed: 2007-01-29
Assignee
ADVANCED MICRO DEVICES, INC.
5204 EAST BEN WHITE BOULEVARD, AUSTIN, TEXAS, 78741
Covered Property (1)
Method and Test Structure for Estimating Focus Settings in a Lithography Process Based on Cd Measurements
Patent: 8,040,497 →
Application: 11/755,245 →
Publication: US 2008/0131796
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 9, 2007
From: KIM, DOO-GON; KIM, YOUN-CHEUL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 019672/0378 →
Affirmation of Patent Assignment Aug 18, 2009
From: ADVANCED MICRO DEVICES, INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 023120/0426 →
Security Agreement Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
Release of Security Interest Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
Release of Security Interest May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →